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Browse the departmentHome » Products » Photonics & R&D » Cameras & Imaging » Advanced Imaging » Adapters, Lenses & Systems » ToupTek DIC100 – Differential Interference Contrast (DIC) Microscopy System
ToupTek DIC100 is a differential interference contrast (DIC) microscopy system based on dual-beam polarization interference (Nomarski prism). It reveals microrelief and refractive index differences in transparent samples, delivering a high-contrast image with pseudo-three-dimensional relief – without staining.
Polarized light is split by a Nomarski prism into two orthogonal beams with a phase difference; after passing through the sample and recombining, the analyzer generates interference that converts optical path differences into contrast and the impression of three-dimensional relief. Unlike phase contrast, DIC produces no halo and retains higher resolution.
| Technique | DIC – differential interference contrast |
| Objectives | 2x-50x (std 60 mm / long-WD 95 mm) |
| Imaging path | 1x (tube 180-200 mm) |
| Image circle | 25 mm |
| Band | visible light (400-700 nm) |
| Camera interface | C / M42 / M52 |
| Illumination | Kohler, LED 10 W / 3 W |
We select ToupTek systems, objectives and adapters to match your microscope/camera and application. Contact Interlab for a quote and configuration guidance.
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Product: ToupTek DIC100 – Differential Interference Contrast (DIC) Microscopy System