ToupTek – Multispectral Machine Vision Lenses (SWIR and UV)

Professional ToupTek multispectral lenses cover bands beyond visible light – SWIR (900–1700 nm) and UV (200–1000 nm), as well as the imported Computar VSW series (400–1700 nm). The high-resolution optical design and broadband coatings deliver high image quality for high-resolution sensors.

Why a dedicated SWIR / UV lens?

Standard lenses are designed for visible light and lose sharpness and transmission beyond it. SWIR/UV lenses have optics and coatings matched to their band, which enables correct imaging in SWIR and UV cameras – including silicon inspection, food inspection, and UV detection.

Key features

  • Bands SWIR 900–1700 nm and UV 200–1000 nm
  • 2/3″, 1″, 4/3″ SWIR series; UV C/F-mount
  • Imported Computar VSW series (400–1700 nm, apochromatic)
  • High resolution (up to 100 lp/mm), low distortion
  • Broadband coatings, C / F mount
  • Wide choice of focal lengths (5–85 mm)

Technical specification

BandsSWIR 900–1700 nm; UV 200–1000 nm; VSW 400–1700 nm
Series2/3″, 1″, 28 mm, 4/3″ SWIR; UV; Computar VSW
Focal lengths5–85 mm (by series)
Resolutionup to 100 lp/mm
MountC / F
Coatingsbroadband multilayer

Applications

  • Semiconductor inspection (SWIR)
  • Food and moisture inspection
  • UV detection and fluorescence
  • Material analysis and sorting

Request a quote and configuration

We select ToupTek systems, lenses, and adapters to match your microscope/camera and application. Contact Interlab to get a quote and configuration recommendation.

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📄 Katalog Enhanced Imaging (ToupTek)

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Product: ToupTek – Multispectral Machine Vision Lenses (SWIR and UV)