Luna OVA 5000

Optical vector analyzer based on real measurement of the complete Jones matrix (Jones Matrix Elements measurement). An instrument for fast and precise characterization of optical and fiber components.

Measurement of the complete Jones matrix
Fast and precise characterization of optical and fiber components
Swept-wavelength Interferometry method
Comprehensive characterization: PDL, phase, GD, CD, PMD
Measurement in less than 3 seconds

LUNA OVA 5000

Uses the Swept-wavelength Interferometry method to characterize passive loss-generating components, polarization-dependent loss (PDL), phase, group delay, chromatic dispersion and polarization mode dispersion. In a measurement lasting less than 3 seconds.

LUNA (OVA) is the only device on the market capable of performing a complete and full measurement of single-mode optical components in a single scan. The OVA provides comprehensive characterization covering all components such as dispersion compensators, AWGs, Bragg gratings and many other optical devices.